Bruker Nano's XFlash® 5000 series of silicon drift detectors (SDD) for high-resolution EDS analysis now includes the XFlash® 5030 T, the first SDD specifically designed for operation on transmission electron microscopes (TEM/STEM). Also part of the product range is the
e-Flash, a high-speed electron backscatter diffraction (EBSD) detector.
Bruker's long-standing experience in SDD development has lead to a liquid nitrogen-free detector that meets all the requirements for safe and reliable operation on TEM/STEM. The XFlash® 5030 T permits much faster data collection and shows better light element performance than Si(Li) detectors. Besides providing excellent and stable energy resolution, it is capable of handling extreme count rates and can easily withstand X-ray overload conditions.
The e-Flash EBSD detector is part of the QUANTAX CrystAlign EBSD analysis system. It is equipped with a sensitive high-speed camera and permits the acquisition of 630 frames per second using 4x4 binning and 800 fps using 8x8 binning. The detector is vertically adjustable, even while the SEM is in operation. This enables signal optimization and supports operation at various working distances. Bruker's fully integrated single EDS/EBSD software interface allows exceptionally fast combined EDS and EBSD analysis.