Olympus launched for Latin America the LEXT OLS300, a new confocal laser-scanning microscope. It features: Brightfield observation: Color information can be obtained from brightfield (color) observation. Therefore, brightfield observation can be used effectively to observe a flaw on a color filter or to locate the position of an area of corrosion on metal. DIC (Differential Interference Contrast) observation: In DIC observation, it is possible to observe a scratch or flaw as small as a few nanometers in height that could not be observed in a brightfield observation. Laser confocal: Observation with a much higher level of resolution impracticable with conventional microscopes is now possible through a combination of a 408 nm laser and confocal optics. Laser confocal DIC: Microscopic unevenness on a surface can be observed in three dimensions in real time, which is impossible with conventional laser microscopes. Observation of surface conditions with the level of dimensional reality comparable to that of an SEM has been made fully possible, opening up a new dimension in surface profile observation. ROI (Region of Interest) noise filter: Areas can be specified on the screen, and different filtering operations can be performed for each area. An ideal 3D image can be obtained.