Multi-element analysis for all kinds of samples, from carbon to uranium
Elemental analysis is as easy as 1,2,3. The energy-dispersive X-ray fluorescence (EDXRF) spectrometer S2 PUMA offers all you need to measure and monitor elements in your samples, independent of the industry or environment you are working in. The outstanding strength of the S2 PUMA LE is the wide range of elements covered by the technique, from very light elements like C, to heavy elements like U. Key features are the unmatched detection limits, precision and speed in EDXRF by HighSense™ technology; the direct-excitation, closely coupled beam path; a X-ray tube with up to 50 W power and 50 kV excitation. The detector XFlash SDD has an excellent energy resolution. The optimal Light Element (LE) configuration with thin-window X-ray tube and XFlash X-ray detector allows the detection of lighter elements. HighSense™ is the key to unrivaled analytical performance of the S2 PUMA. The instrument's direct excitation beam path makes full use of the 50-Watt power of the X-ray tube. The optimal excitation of all elements in the sample is guaranteed with up to 50 kV voltage. The high-count-rate, high resolution XFlash silicon drift detector (SDD) further enhances the instrument's performance and records sample spectra in HD mode. But that's not all. With the all-new instrument X-ray optics, the distances between the X-ray tube, the sample and the detector are even shorter than before. This results in better detection limits, higher precision and shorter measurement times.